Browse Prior Art Database

Core Plane Test System

IP.com Disclosure Number: IPCOM000092148D
Original Publication Date: 1968-Oct-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 48K

Publishing Venue

IBM

Related People

Dehais, RE: AUTHOR [+3]

Abstract

The apparatus is for testing ferrite cores 2 as they are assembled on row wires 3 and column wires 4 and 5 of a memory core frame. Each wire 3 is strung with a number of cores located to the right of the components shown. In a wiring operation, one core on wire 3 is advanced to the left and is held against tool 6 that aligns the cores to be threaded by a single column wire. The column of wire 4 is completed and the column of wire 5 is wired and is undergoing test.

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Core Plane Test System

The apparatus is for testing ferrite cores 2 as they are assembled on row wires 3 and column wires 4 and 5 of a memory core frame. Each wire 3 is strung with a number of cores located to the right of the components shown. In a wiring operation, one core on wire 3 is advanced to the left and is held against tool 6 that aligns the cores to be threaded by a single column wire. The column of wire 4 is completed and the column of wire 5 is wired and is undergoing test.

Test signal generator 7 is connected to one end of wire 5 to produce a test signal on wire 5. The other end of wire 5 is connected to tool 6 which forms a return current path to generator 7. The close proximity of tool 6 to wire 5 enhances the signal propagating characteristics of the wire and thus improves the test. Cores 2 undergo flux changes in response to the currents on wire 5 and produce voltages that are detected by detector circuits 8. An individual detector circuit 8 is provided for each row wire and each core of the selected column is tested simultaneously. If a defective core is found, it is broken and removed and the next core of the row is advanced to rewind the column.

Detector circuits 8 are arranged to control a visual display that identifies a defective core. Where a defect is caused by stress on a good core from the core plane wires, the test operator adjusts the core positions and observes on the display whether this operation corrects the defect.

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