Browse Prior Art Database

Infrared Observation and Inspection of Devices by TV

IP.com Disclosure Number: IPCOM000092158D
Original Publication Date: 1968-Oct-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 56K

Publishing Venue

IBM

Related People

Benati, JA: AUTHOR [+3]

Abstract

This technique is for infrared observation and inspection of semiconductor devices by a TV camera. The drawings show a monolithic circuit chip viewed under either visible or infrared light. The apparent transparency of such chips to infrared light is used for semiconductor observation, inspection, and testing. A closed circuit television system with a videcon tube sensitive into the near infrared wave lengths is used for nondestructive observation of mounted devices. Implementation includes a fixture to hold the device-mounted substrate, an infrared source, optics to focus the infrared source onto the area to be viewed, and an infrared sensitive TV camera with magnification lenses and a viewing monitor. Additionally, devices can be placed, with great precision, by utilizing the device's transparency to infrared radiation.

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Infrared Observation and Inspection of Devices by TV

This technique is for infrared observation and inspection of semiconductor devices by a TV camera. The drawings show a monolithic circuit chip viewed under either visible or infrared light. The apparent transparency of such chips to infrared light is used for semiconductor observation, inspection, and testing. A closed circuit television system with a videcon tube sensitive into the near infrared wave lengths is used for nondestructive observation of mounted devices. Implementation includes a fixture to hold the device-mounted substrate, an infrared source, optics to focus the infrared source onto the area to be viewed, and an infrared sensitive TV camera with magnification lenses and a viewing monitor. Additionally, devices can be placed, with great precision, by utilizing the device's transparency to infrared radiation.

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