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Browse Prior Art Database

Multipoint Probe

IP.com Disclosure Number: IPCOM000092191D
Original Publication Date: 1968-Oct-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 47K

Publishing Venue

IBM

Related People

Lambert, B: AUTHOR

Abstract

This multipoint probe uses etched metallic masks obtained by photolithographic techniques thus realizing great accuracy. The fabrication process comprises various steps. Two identical metallic masks are aligned on a registration plate comprising four centering pins. In each hole formed by the two corresponding apertures of the two masks, there is introduced a copper wire which subsequently constitutes one tip of the probe body. A knot is made at the end of each wire on the lower face of the interior mask. The masks are then separated and a shim is introduced between them. The overall arrangement is accurately registered using centering pins and the space between the masks is filled with an epoxy resin. The masks are removed after solidification and the lower face is polished.

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Multipoint Probe

This multipoint probe uses etched metallic masks obtained by photolithographic techniques thus realizing great accuracy. The fabrication process comprises various steps. Two identical metallic masks are aligned on a registration plate comprising four centering pins. In each hole formed by the two corresponding apertures of the two masks, there is introduced a copper wire which subsequently constitutes one tip of the probe body. A knot is made at the end of each wire on the lower face of the interior mask. The masks are then separated and a shim is introduced between them. The overall arrangement is accurately registered using centering pins and the space between the masks is filled with an epoxy resin. The masks are removed after solidification and the lower face is polished. Gold is chemically deposited on the apparent end of the copper wires achieving the probe points and improving conductivity of the contact.

The ceramic sheet which supports the electrical pattern to be tested is mounted on a rubber plate by pins. The contact is achieved by pressing down the probe body against the electrical pattern when a test takes place.

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