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Core Storage Plane Tester

IP.com Disclosure Number: IPCOM000092308D
Original Publication Date: 1968-Nov-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 39K

Publishing Venue

IBM

Related People

Gibbons, LP: AUTHOR

Abstract

Since ferrite memory cores are sometimes damaged during storage plane assembly, it is desirable to retest them individually after the storage plane is partly or fully wired. This tester utilizes the X and Y conductors of the plane for testing individual cores. The plane's X wires are temporarily jumpered at 10, 12, 14, and 16 to connect X conductor pairs 18-19, 20-21, etc., into loops. These are connected to X drive and sense apparatus by twisted pairs 24, 26, 28, and 30. One conductor of each X pair is connected to ground by bus 32. The other is selectively coupled to drive and sense bus 34 via relay contacts 36, 38, 40, and 42.

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Core Storage Plane Tester

Since ferrite memory cores are sometimes damaged during storage plane assembly, it is desirable to retest them individually after the storage plane is partly or fully wired. This tester utilizes the X and Y conductors of the plane for testing individual cores. The plane's X wires are temporarily jumpered at 10, 12, 14, and 16 to connect X conductor pairs 18-19, 20-21, etc., into loops. These are connected to X drive and sense apparatus by twisted pairs 24, 26, 28, and 30. One conductor of each X pair is connected to ground by bus 32. The other is selectively coupled to drive and sense bus 34 via relay contacts 36, 38, 40, and
42.

For X drive, bus 34 is connected via conductor 44 and contacts 46 and 48 to positive and negative X drive pulse sources 50, 52. For sense line operation, bus 34 is connected via transformer 54 to sense amplifier 56 providing a test output at 58. The impedance of the transformer primary circuit is made high enough to avoid undesirable loading of the X drive pulses. The Y conductors of the plane array are grounded at one end by a connection 70 and are individually connected at their other ends by contacts 72 to source 74 of Y drive pulses.

To test core 76, contact 72 for line 78 is closed. Drive pulse 80 issues from source 74 to reset all cores on line 78. Contacts 36 and 46 are also closed. A positive X drive pulse 82 issues from source 50 to set core 76. The other cores in the X column with core 76 are set also. This has no effect on the test. A second Y drive pulse 84 then issues from source 74 to line 78. Since core 76 is set by pulse 82, core 76 is now switched again by pulse 84. During the time of pulse 84, sense amplifier 56 is gated on so as to yield an output pulse 86 r...