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Automatic Semiconductor Crystal Probe

IP.com Disclosure Number: IPCOM000092499D
Original Publication Date: 1966-Nov-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 72K

Publishing Venue

IBM

Related People

Dessauer, RG: AUTHOR [+3]

Abstract

The testing apparatus automatically indexes a semiconductor crystal under a resistivity probe head which descends at equal set intervals. Semiconductor crystal 1 is positioned in V-slotted carriage or cradle 2, such that probe pins 3 are located above the desired section for initial reading. Vertical position of probe head 4 is adjusted by turning screw 6. The undulating action of head 4 is derived from cam 7 lifting follower slide 8 and compression spring 9 returning the same. In synchronism with the probe drive is carriage drive 10 both emanating from a common gear box not shown.

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Automatic Semiconductor Crystal Probe

The testing apparatus automatically indexes a semiconductor crystal under a resistivity probe head which descends at equal set intervals. Semiconductor crystal 1 is positioned in V-slotted carriage or cradle 2, such that probe pins 3 are located above the desired section for initial reading. Vertical position of probe head 4 is adjusted by turning screw 6. The undulating action of head 4 is derived from cam 7 lifting follower slide 8 and compression spring 9 returning the same. In synchronism with the probe drive is carriage drive 10 both emanating from a common gear box not shown.

The indexing of carriage 10 by geneva wheel 11 is such that carriage 10 moves only when head 4 is elevated. To retain head 4 in up position, solenoid 12 is energized, advancing shaft 13 into locating hole in slide 8. The restraining of head 4 must be available whenever an undersized diameter section of crystal 1 is positioned under pins 3.

Microswitch 14 senses this deformity through roller 15 which is radially displaced along the outer surface of crystal 1. Indices 16 along carriage apron 17 permit the location of any measured section on crystal 1 after it is removed from cradle 2. Readings derived from head 4 are printed out automatically from a recorder not shown.

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