Browse Prior Art Database

Electron Beam Geometry Control

IP.com Disclosure Number: IPCOM000092549D
Original Publication Date: 1966-Dec-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 24K

Publishing Venue

IBM

Related People

Kreitzer, NH: AUTHOR

Abstract

Latent images can be produced on a photographic media using a focused beam of electrons as the source of illumination. This system applies to a focused beam of electrons. The beam is electromagnetically deflected in straight lines in a single orthogonal coordinate system and for which it is desired to produce lines of varied width in either axis.

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Electron Beam Geometry Control

Latent images can be produced on a photographic media using a focused beam of electrons as the source of illumination. This system applies to a focused beam of electrons. The beam is electromagnetically deflected in straight lines in a single orthogonal coordinate system and for which it is desired to produce lines of varied width in either axis.

Varied line widths in such systems can be achieved either by defocusing the electron beam or by an oscillatory electrostatic deflection of the beam orthogonal to the axis of electromagnetic deflection.

In this system, two oscillatory electrical scanning signals are applied simultaneously to two orthogonal electrostatic deflection plates. The axis of the plates is in coincidence with the axis of electromagnetic deflection. Such a system can be used to scan the focused electron beam in a rectangular pattern of variable size. Lines of varied width can be recorded without plate switching and with square end points, for any direction of electromagnetic deflection, given the following rate constraint. The scan signals are related by a constant frequency ratio of at least five to one.

In the drawing an example of the electrostatic scan raster is shown as R with the electromagnetic deflection indicated as R'. It is assumed that the X scan signal is the lower frequency scan signal. The relationship of the scans is given as R' approx.< RD/10. In the equation, D equals X-scan size (mils/scan), R equal...