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Test Instrument Capacitor

IP.com Disclosure Number: IPCOM000092661D
Original Publication Date: 1967-Feb-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 43K

Publishing Venue

IBM

Related People

Jako, C: AUTHOR

Abstract

The angular displacement, velocity, or acceleration of a shaft 10 and the like is determined by suitable electronic circuitry used with the variable capacitor shown. The differential capacitor has low inertia and is free of complications introduced by slip rings and the like. Low inertia sleeve 12 is slipped over shaft 10. Alternatively, a split sleeve, not shown, is clipped to a shaft where there is no access to an end. Sleeve 12 has a thin metallic plating 14, exaggerated in the drawing, semitubular in configuration, which rotates with shaft 10. A pair of complementary thin platings, also exaggerated, 16 and 18 are laid down in a semitubular groove of block 20 of insulating material. Block 20 is supported on rods 22 and 23 to which base 26 is fitted.

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Test Instrument Capacitor

The angular displacement, velocity, or acceleration of a shaft 10 and the like is determined by suitable electronic circuitry used with the variable capacitor shown. The differential capacitor has low inertia and is free of complications introduced by slip rings and the like. Low inertia sleeve 12 is slipped over shaft
10. Alternatively, a split sleeve, not shown, is clipped to a shaft where there is no access to an end. Sleeve 12 has a thin metallic plating 14, exaggerated in the drawing, semitubular in configuration, which rotates with shaft 10. A pair of complementary thin platings, also exaggerated, 16 and 18 are laid down in a semitubular groove of block 20 of insulating material. Block 20 is supported on rods 22 and 23 to which base 26 is fitted. Block 20 is arranged for adjustment on rods 22 and 23 in the vertical direction. Base 26 is simply moved in the two horizontal directions as required to align the platings 14, 16, and 18.

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