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Picosecond Sampling Oscilloscope

IP.com Disclosure Number: IPCOM000092678D
Original Publication Date: 1967-Feb-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 30K

Publishing Venue

IBM

Related People

Kohn, G: AUTHOR

Abstract

In sampling oscilloscopes, variable time delay is realized by comparison of ramp and staircase signals. Complicated circuitry required for these functions generates a variable delay of, e.g., 1 to 50 pico-seconds, on top of initial delay of, e.g., 0.1 microsecond. In consequence slight variations of initial delay cause jitter which disturbs CRT display. Furthermore, an initial delay has to be compensated by a fixed delay in series to the test circuit. A fixed delay line of length required seriously limits bandwidth of the test signal. To avoid jitter, electronic variable delay circuitry is replaced by a microwave variable delay line. Trombone type delay lines as well as switchable lines are suitable.

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Picosecond Sampling Oscilloscope

In sampling oscilloscopes, variable time delay is realized by comparison of ramp and staircase signals. Complicated circuitry required for these functions generates a variable delay of, e.g., 1 to 50 pico-seconds, on top of initial delay of, e.g., 0.1 microsecond. In consequence slight variations of initial delay cause jitter which disturbs CRT display. Furthermore, an initial delay has to be compensated by a fixed delay in series to the test circuit. A fixed delay line of length required seriously limits bandwidth of the test signal. To avoid jitter, electronic variable delay circuitry is replaced by a microwave variable delay line. Trombone type delay lines as well as switchable lines are suitable. A short fixed delay line with large bandwidth for test signals provides sufficient initial delay to make a test signal and a sampling pulse coincide at the sampling head.

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