Browse Prior Art Database

Probe and Probe Head for Tester

IP.com Disclosure Number: IPCOM000092972D
Original Publication Date: 1967-Apr-01
Included in the Prior Art Database: 2005-Mar-05
Document File: 2 page(s) / 72K

Publishing Venue

IBM

Related People

Kurtz, FJ: AUTHOR

Abstract

This probe and probe head Permit testing of miniaturized electronic devices. The probe points are retractable which prevents damage when not in use. The probe can be grouped in a close spacial array of the order of .020 inches on centers.

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Probe and Probe Head for Tester

This probe and probe head Permit testing of miniaturized electronic devices. The probe points are retractable which prevents damage when not in use. The probe can be grouped in a close spacial array of the order of .020 inches on centers.

In one form, drawing A, probe 10 comprises plastic housing 20 having central bore 22 of two different diameters 24 and 26. Tungsten wire 27 is cut to proper length and contact tip 28 is ground on one end. The opposite end is soldered or swaged to spring-loaded plunger 30, typically a Pogo plunger, part DTF, manufactured by Pylon Co., Inc., Attleboro, Massachusetts. A co-ax cable, less the center conductor, or tube 30 is cut to proper length. A portion of the outer conductor is removed to expose TEFLON* insulation 34. The latter is urged through the smaller bore 24 and joined to housing 20 by epoxy.

The tungsten wire portion outside the tube is adjusted to be withdrawn by operating of the spring-loaded contact member. Plunger 30 is threaded on its outside surface. The plastic housing is similarly threaded in bore 22 to accept plunger 30.

In another form, drawing B, a double probe end can be formed by cutting co- ax member 32 at approximately a 60 degrees angle to establish point contact 36. Member 32 is rhodium plated for contact surface and hardness. The separation between wire contact 28 and co-ax contact 36 as a pair of probe points is of the order of .010 inches. Reduction of the diameter of me...