Browse Prior Art Database

Component Lead Force Measuring Device

IP.com Disclosure Number: IPCOM000093148D
Original Publication Date: 1967-Jun-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 31K

Publishing Venue

IBM

Related People

Kuhn, RF: AUTHOR [+2]

Abstract

Static dynamic forces applied to leads of an electrical component during automatic processing are measured by this reusable device.

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Component Lead Force Measuring Device

Static dynamic forces applied to leads of an electrical component during automatic processing are measured by this reusable device.

Device 1 comprises cantilevered beam 2 overlying and anchored at one end to base 3. Device 1 is configured to fit within housing 4 identical with that of the particular component, such as a transistor, on which lead force is to be measured. This provides the unit with an external configuration identical with that of such component to enable the unit to be handled by automatic machines in the same manner as if it were such a component. Strain gage 5 mounted on beam 2 has lead wires 6 and 7 that are brought out of the side or top of 4, as preferred. Leads 8...10, similar to leads of the component or else cut off discarded portions of such leads, are inserted into base 3 such that lead 9 passes with slight clearance through a smooth bore in base 3 and is screw- threaded into an aligned tapped bore in beam 2. The remaining leads 8 and 10 are screw-threaded into tapped bores in base 3. Strain gage 5 measures the force only on 9.

For maximum sensitivity, beam 2 is as stiff as possible to reproduce accurately the forces applied to the leads in gripping, transporting or forming operations. For repetitive measurements of stresses during a particular machine operation, only the leads need be replaced. A component need not be destructively tested or reinstrumented for each measurement.

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