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Achromatic Sine Wave Generator

IP.com Disclosure Number: IPCOM000093170D
Original Publication Date: 1967-Jun-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 33K

Publishing Venue

IBM

Related People

Lohmann, AW: AUTHOR

Abstract

This technique varies the spatial frequency of a periodical test pattern to provide a sinusoidal brightness distribution. Plane M2 contains moire fringes characterized by light contribution only from two points, +/- 1, from plane M1. The spatial frequency can be varied by means of the angles +/-epsilon. The intensity loss due to the gratings and the masks is 4/ pi 4 approx.= 1/25. White light as well as monochromatic can be used at S1. Also, a finite-extended S1 gives more light. The image at plane I has a sinusoidal intensity profile and can be used in testing lens system LcLo by focusing on phototube PMT through slit S2.

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Achromatic Sine Wave Generator

This technique varies the spatial frequency of a periodical test pattern to provide a sinusoidal brightness distribution. Plane M2 contains moire fringes characterized by light contribution only from two points, +/- 1, from plane M1. The spatial frequency can be varied by means of the angles +/-epsilon. The intensity loss due to the gratings and the masks is 4/ pi 4 approx.= 1/25. White light as well as monochromatic can be used at S1. Also, a finite-extended S1 gives more light. The image at plane I has a sinusoidal intensity profile and can be used in testing lens system LcLo by focusing on phototube PMT through slit S2.

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