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Bent Pin Testing Apparatus

IP.com Disclosure Number: IPCOM000093424D
Original Publication Date: 1967-Sep-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 86K

Publishing Venue

IBM

Related People

Sweetland, ER: AUTHOR

Abstract

The apparatus determines the presence of bent pins in a substrate such as a module containing a plurality of pins.

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Bent Pin Testing Apparatus

The apparatus determines the presence of bent pins in a substrate such as a module containing a plurality of pins.

An abutting train of modules 10 is gravitationally fed down track 11 to test station 12 where a module 10 is retained by latch 13. Testing grid probe 14, having a plurality of apertures 15 in registration with the pins in module 10, is moved into engagement with pins 16 by piston 17 driven by compressed air device 18 which acts upon carriage 19 supporting probe 14. Upon the forward stroke of piston 17, control device 19 is activated through the release of switch
21. The latter is normally held closed by arm 22 on carriage 19. With the activation of control 20, trapdoor 23 along the lower portion of track 11 is subsequently opened to direct module 10 off the track. Such occurs after module 10 is released from the test station unless control 24 is also activated on the forward stroke of piston 17 of arm 22 contacting switch 25. If control 24 is so activated, trapdoor 23 is retained in the closed position and the released module 10 is permitted to proceed unhindered down the lower portion of track 11.

If there are no bent pins in a module 10, pins 16 are fully engaged by holes 15 in grid 14 and piston 17 completes its cycle causing the activation of control
24. Upon the completion of the forward stroke, grid 14 moves back out of engagement with a module 10 and latch arm 26 pivots latch 13 out of engagement to release module 10...