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Magnetic Properties Test Instrument

IP.com Disclosure Number: IPCOM000093700D
Original Publication Date: 1966-Jan-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 36K

Publishing Venue

IBM

Related People

Chang, PT: AUTHOR [+4]

Abstract

Thin films can have their magnetic properties measured in this test instrument which is movable to any position in a single plane. As the film is moved, it is subjected to a high magnetic field. Magneto-optic detection is performed to measure the magnetic properties of the films.

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Magnetic Properties Test Instrument

Thin films can have their magnetic properties measured in this test instrument which is movable to any position in a single plane. As the film is moved, it is subjected to a high magnetic field. Magneto-optic detection is performed to measure the magnetic properties of the films.

The test instrument comprises supporting structure 1 which is immersed in a magnetic field generated by magnetic coil 2 wound around the entire test instrument.

Base member 6 is mounted in dovetail fashion to structure 1. Rack 4 at one side of member 6 meshes with pinion gear 5 for accomplishing transverse movement of member 6 with respect to structure 1. The instrument also includes block 7 mounted in dovetail fashion to member 6. Block 7 provides for lateral movement of thin film test element 3.

Movement of block 7 in the lateral plane is accomplished through rod 8 connected to micrometer 9. Transverse movement of test element 3 is accomplished by rod 10 connected to pinion gear 5 from micrometer 11. Movement of micrometers 9 and 11 positions any discrete area of the test element for magneto-optic detection.

Laser beam source 12 is provided for magneto-optic detection of the Kerr type. It directs its light beam 13 at a particular area on test element 3. Dependent on the magnetic properties at that area, reflection of beam 13 is made to laser analyzer 14. While detection occurs, coil 2 generates a magnetic field enabling detection to occur as the magn...