Browse Prior Art Database

Component Socket for Temporary Connection to a Tester Processing Station

IP.com Disclosure Number: IPCOM000094250D
Original Publication Date: 1966-Aug-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 74K

Publishing Venue

IBM

Related People

Bruder, SI: AUTHOR [+2]

Abstract

A component holder comprising a socket having test pins 2, 3 and 4 is mounted on a conveyor support or carrier 5 with the pins extending below its bottom.

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Component Socket for Temporary Connection to a Tester Processing Station

A component holder comprising a socket having test pins 2, 3 and 4 is mounted on a conveyor support or carrier 5 with the pins extending below its bottom.

The pins generally have a tubular configuration and include radial portions 6 from which split resilient clip portions 7 extend upwardly through circumferentially spaced vertical openings 9 in the holder. The tops of the openings 8 and clip portions 7 are adapted to receive and guide the leads 9 of a component, such as transistor 10, for mounting of it in electrical connection with the test pins.

Mounted below the support 5 at the test station are a series of contact stations 13, pivotally mounted by pin 11 on a base or support 12. Each station has secured on the top a set of split contact members 14 and 15. These are resiliently biased toward each other and disposed in the path of a corresponding test pin so that the pins enter between their respective set of contact members. The leading and trailing portions 16 and 17 of the contact members diverge outwardly to facilitate entry into and withdrawal of the pins from between the split contact members 14 and 15 as carrier 5 moves across the contact stations 13. Pivotal mounting of the contact stations 1 permits them to accommodate minor deviations of the test pins in their orientation for entry between the split contact members 14 and 15.

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