Browse Prior Art Database

Defect Analysis

IP.com Disclosure Number: IPCOM000094494D
Original Publication Date: 1965-Feb-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 24K

Publishing Venue

IBM

Related People

Gilmore, PC: AUTHOR [+2]

Abstract

In order to compute an optimum cutting pattern for stock, such as a board 1, the location of any defects 2 must be determined.

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Defect Analysis

In order to compute an optimum cutting pattern for stock, such as a board 1, the location of any defects 2 must be determined.

The location of each defect can be given by specifying the coordinates of the four corners of a rectangle 3 that includes the defect. The defective region can also be isolated by specifying only the coordinates of two opposite corners of the rectangle, i. e., lower left and upper right, or upper left and lower right.

Furthermore, since the rectangles 3 do not overlap, they need not be distinguished when specifying the coordinates of their corners. That is, when two defects are present as shown, it is sufficient to specify the lower left and upper right coordinates for each rectangle 3 without an indication of the rectangle to which the coordinates apply. The coordinates are then analyzed by the optimum cutting pattern computer. Such determines which coordinates are to be paired together to describe each rectangle, e. g., which lower left coordinate should be paired with an upper right coordinate to describe one of the rectangles.

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