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Compensating Variations in X Ray Intensities

IP.com Disclosure Number: IPCOM000094495D
Original Publication Date: 1965-Feb-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 2 page(s) / 36K

Publishing Venue

IBM

Related People

Krouse, DR: AUTHOR

Abstract

Variations in X-ray intensities arising from fluctuations in filament current of an X-ray tube are reduced to a minimum by this system.

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Compensating Variations in X Ray Intensities

Variations in X-ray intensities arising from fluctuations in filament current of an X-ray tube are reduced to a minimum by this system.

A high-voltage source in conjunction with a resistor R is placed in a circuit path connecting the filament and target electrodes of the X-ray tube. As voltage fluctuations arise due to changes in filament current, the voltage drop reflected across the resistor R is entered into a voltage to frequency converter. This develops a frequency f2 proportional to the voltage drop across the resistor R.

Frequency f2 is fed into a counter, initially preset. This counter, in turn, supplies a control pulse after termination of a preset time interval delta t to interrupt the counting operations in an electronic counter. Such accumulates a count representing a value related to the X-ray intensity of the tube. This relation is established in terms of a frequency f1. This is a function of the X-ray intensity of the tube and is derived from a detector influenced by the X-ray beam.

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