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Channel Modification for Fault Location Tests

IP.com Disclosure Number: IPCOM000094817D
Original Publication Date: 1965-Jun-01
Included in the Prior Art Database: 2005-Mar-06
Document File: 1 page(s) / 12K

Publishing Venue

IBM

Related People

King, LE: AUTHOR [+3]

Abstract

Sequences of tests can be generated to locate defects in the various circuits of a data processing unit. Such a sequence can consist of as many as 100,000 fault location tests for a relatively large processor. The data communications channel, between the I/O device containing the test sequence and the processing unit, is adapted to load the tests into storage. This is effected in such a manner as to permit a fault location test (FLT) control unit to run the fault location tests without the aid of the central processor, the FLT control unit being provided for this purpose. It is the function of the channel unit to load the tests, keep the FLT control unit aware of the progress of the tests, stop and restart on command from the FLT control unit and retry when a data error is detected.

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Channel Modification for Fault Location Tests

Sequences of tests can be generated to locate defects in the various circuits of a data processing unit. Such a sequence can consist of as many as 100,000 fault location tests for a relatively large processor. The data communications channel, between the I/O device containing the test sequence and the processing unit, is adapted to load the tests into storage. This is effected in such a manner as to permit a fault location test (FLT) control unit to run the fault location tests without the aid of the central processor, the FLT control unit being provided for this purpose. It is the function of the channel unit to load the tests, keep the FLT control unit aware of the progress of the tests, stop and restart on command from the FLT control unit and retry when a data error is detected.

The sequence which is placed on magnetic tape or other I/O media consists of a series of records. The first two contain appropriate channel control words for reading the tests of the remaining records into appropriate buffer areas of the storage. Two such buffer areas are provided. These are alternately filled so that the tests in one buffer area can run while the other buffer area is being filled. A word count register in the channel unit is set to the number of locations in each buffer area such that when the word count goes to zero, the channel unit transfers to a command which loads the other buffer area. Since in normal operation of t...