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Capacitance Test Circuit

IP.com Disclosure Number: IPCOM000095742D
Original Publication Date: 1964-Jun-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 53K

Publishing Venue

IBM

Related People

Patti, MJ: AUTHOR [+2]

Abstract

In this capacitance test circuit, a test socket is employed which prevents stray capacities from interfering with very low capacitance measurements.

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Capacitance Test Circuit

In this capacitance test circuit, a test socket is employed which prevents stray capacities from interfering with very low capacitance measurements.

At A, capacity bridge 10 is used to measure the capacitance between pins 12 on module 14, when the module is inserted into socket 16. The details of test socket 16 are shown at B. It includes a solid block of conductive material 18, such as copper or brass, which has been drilled and tapped to receive coaxial cable connector 20. Each connector 20 has two female socket portions 22 and
24. One portion receives pins 12 from module 14. The other portion is connected to inner conductor 26 of a coaxial cable.

Female portion 22 is insulated from conductive material 18 by sleeve 23. Outer conductor 28 is connected directly to conductive material 18 at 29 to provide a continuous shield from pin to cable. Portion 22 is countersunk from the surface of conductive material 18. Thus, when pins 12 are inserted, the bottom of module 14 rests directly on the connector body. Each of the coaxial cables connects a pin 12 to a coaxial multiplexor and capacity bridge 10 in which any two cables are selected for capacity measurement. This configuration completely shields each pin from all others and prevents stray capacities from upsetting the measurements of bridge 10.

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