Browse Prior Art Database

Control of Magnetic Anistropy of Evaporated Films

IP.com Disclosure Number: IPCOM000095947D
Original Publication Date: 1964-Oct-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 29K

Publishing Venue

IBM

Related People

Bate, G: AUTHOR [+3]

Abstract

The magnetic anisotropy of vacuum deposited, oblique-incidence magnetic films can be controlled by the thickness of an aluminum underlayer. The overdeposited magnetic film is isotropic at a certain critical underlayer thickness. Thickness of an underlayer less than the critical thickness induces an easy axis in the subsequently vacuum deposited film parallel to the direction of the metallic vapor stream. An underlayer thickness greater than the critical thickness induces an easy axis in the subsequently vacuum deposited film perpendicular to the direction of the vapor stream.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 97% of the total text.

Page 1 of 2

Control of Magnetic Anistropy of Evaporated Films

The magnetic anisotropy of vacuum deposited, oblique-incidence magnetic films can be controlled by the thickness of an aluminum underlayer. The overdeposited magnetic film is isotropic at a certain critical underlayer thickness. Thickness of an underlayer less than the critical thickness induces an easy axis in the subsequently vacuum deposited film parallel to the direction of the metallic vapor stream. An underlayer thickness greater than the critical thickness induces an easy axis in the subsequently vacuum deposited film perpendicular to the direction of the vapor stream.

Aluminum underlayers of a series of thicknesses between 50 angstroms and 600 angstroms are vacuum deposited onto a plurality of polyethylene terephthalate substrates with the incoming aluminum metal atoms normal to the substrates. A cobalt film having an approximate thickness of 5 microinches is vacuum deposited onto each of the underlayers with the incoming metal atoms making an angle of incidence of 80 degrees with the normal to the plane of the substrate.

The graph shows the relationship of aluminum underlayer thickness to the magnitude and direction of the easy axis of a typical vacuum deposited magnetic film.

Other angles of incidence of the metallic vapor stream can be used to deposit the magnetic film. The increase in the magnetic anisotropy, however, is proportional to the increase in angle of incidence.

1

Page 2 of 2

2

[This page con...