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Electron Beam Measurement

IP.com Disclosure Number: IPCOM000096776D
Original Publication Date: 1963-Nov-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 33K

Publishing Venue

IBM

Related People

Halperin, A: AUTHOR [+2]

Abstract

Two devices for measuring the width of an electron beam are shown. On the left, a digital device has two conducting plates 5 and 6. Beam 7 moves vertically starting from the top of plate 5 and ending at the bottom. Each time beam 7 passes one of the notches a pulse is sent to counter 8. When the beam strikes the sloped edge of plate 6, the counter is stopped. The magnitude of the count indicates the width of beam 7. Smaller beams travel farther down plate 5 causing a higher count in counter 8.

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Electron Beam Measurement

Two devices for measuring the width of an electron beam are shown. On the left, a digital device has two conducting plates 5 and 6. Beam 7 moves vertically starting from the top of plate 5 and ending at the bottom. Each time beam 7 passes one of the notches a pulse is sent to counter 8. When the beam strikes the sloped edge of plate 6, the counter is stopped. The magnitude of the count indicates the width of beam 7. Smaller beams travel farther down plate 5 causing a higher count in counter 8.

On the right, the electron beam measuring device has plate 9 with two notches. Plate 10 is similar to plate 6. Beam 11 moves vertically at a constant speed starting from the top of plate 9 and moving toward the bottom. The interval of time taken for beam 11 to move between the two notches in plate 9 is measured by meter 12. Next, the interval of time required for the beam to pass the lower notch and strike the sloped edge of plate 10 is recorded by meter 12 in response to the signal supplied on line 13. In this manner, the width of beam 11 is calculated by observing the two intervals of time recorded by meter 12 and by observing the slope of plate 10.

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