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Core Testing Device

IP.com Disclosure Number: IPCOM000098153D
Original Publication Date: 1960-Feb-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 42K

Publishing Venue

IBM

Related People

Lamoreaux, WG: AUTHOR

Abstract

The core testing device includes a circuit for comparing the reluctance of a test core with the previously established reluctance of a standard core.

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Core Testing Device

The core testing device includes a circuit for comparing the reluctance of a test core with the previously established reluctance of a standard core.

Initially, a standard core 1 is placed on a non-magnetic adjustable stud 2 having a flange 3 arranged in a transformer 4 including a cup shaped element 5 of magnetic material. A primary winding 6 and a secondary winding 7 are separated by a magnetic separator 8 to reduce magnetic coupling between the windings. Normally, most of the flux created by a current in winding 6 circulates through the lower half of the cup 5, the separator 8 and the center of the winding 6, with some flux linking the winding 7. A core I mounted on stud 2 presents a low reluctance path so that a smaller amount of flux links the winding 7.

The device is first calibrated by placing a standard core on the stud 2. A signal is generated in a unit 9 and is applied to the primary winding 6 and also to a first input terminal of a voltage comparator unit 10. Voltage induced in the secondary winding 7 is applied to a second input terminal to the comparator unit
10. The magnitude and phase of the voltage inputs to the unit 10 from the winding 7 and from the generator 9 are adjusted to coincide.

Each test core having an axial flaw introduces a higher reluctance into the flux path, permitting a greater amount of flux to link the secondary winding 7. The output of the comparison unit 10 is a measure of the amplitude differential between...