Browse Prior Art Database

Oscilloscope Probe

IP.com Disclosure Number: IPCOM000098286D
Original Publication Date: 1960-Jul-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 40K

Publishing Venue

IBM

Related People

Balles, PW: AUTHOR

Abstract

A low resistance probe is provided for testing low voltage, low current devices and assures consistent values of contact resistance between the probe and the terminal. Due to the lock on action of the connector, the operator need not hold the probe during use.

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Oscilloscope Probe

A low resistance probe is provided for testing low voltage, low current devices and assures consistent values of contact resistance between the probe and the terminal. Due to the lock on action of the connector, the operator need not hold the probe during use.

The probe consists of a nonconducting sleeve 10 and a nonconducting base 11 biased apart by a spring 12. An electrically conducting rod 13 is secured in the base 11. The tip 14 of the rod 13 is shaped to complement a terminal 15 to which it is to be attached. Serrations formed on the tip 14 penetrate any surface film of oxide coating formed on the terminal.

To connect the terminal 15, the tip 14 is extended outside the sleeve 10 by sliding the sleeve against the base 11 to allow the terminal to be inserted in the bore of the sleeve 10. When the sleeve slides forward, the periphery of the bore provides a force along a predetermined extent of the terminal to force the terminal into contact with the serrations on the tip 14 to provide a biting or cutting action so that a good metal to metal connection is obtained.

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