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Methods of Compensating for Defects in Superconductive Circuits

IP.com Disclosure Number: IPCOM000098317D
Original Publication Date: 1960-Jul-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Anderson, JL: AUTHOR

Abstract

A practical solution to the reliability problem in thin film superconducting circuits is shown.

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Methods of Compensating for Defects in Superconductive Circuits

A practical solution to the reliability problem in thin film superconducting circuits is shown.

Each substrate bearing cryogenic circuitry is made with at least a duplicate layer. Each layer has the same circuitry as the other. Around the edges of each layer, cryotron gates are placed in series with each input and output lead. A single control line lies across all the gates at the perimeter of each layer. By applying current to the control line controlling all the isolating gates of the top layer and by not applying current to the control line of the bottom layer, the bottom layer only is switched into the system.

By an interchange of control current, the top layer replaces the bottom should the latter develop a defect. The same technique is extended to sections of layers through the use of additional gates and control lines.

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