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Browse Prior Art Database

Test Fixture

IP.com Disclosure Number: IPCOM000098542D
Original Publication Date: 1959-Feb-01
Included in the Prior Art Database: 2005-Mar-07
Document File: 2 page(s) / 47K

Publishing Venue

IBM

Related People

Meehan, JV: AUTHOR

Abstract

This fixture is for removing kinks from transistor leads and then making electrical tests on the transistor prior to encapsulation. It permits the transistor to be handled by its leads during this operation without the operator's fingers coming into contaminating contact with the semiconductor structure.

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Test Fixture

This fixture is for removing kinks from transistor leads and then making electrical tests on the transistor prior to encapsulation. It permits the transistor to be handled by its leads during this operation without the operator's fingers coming into contaminating contact with the semiconductor structure.

The fixture 10 is supported by a chassis 11 under which are mounted suitable test circuits. The fixture includes four insulating plates 12 appropriately spaced to receive the emitter, collector, and base leads 13 of a transistor 14. Conductive coatings 15 on an interior surface of each plate operatively connect the transistor 14 to the test circuits. As the leads are drawn between the plates, the latter comb out the kinks and establish reliable electrical connections with the test circuit.

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