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A Diode Testing Circuit

IP.com Disclosure Number: IPCOM000098842D
Original Publication Date: 1958-Jun-01
Included in the Prior Art Database: 2005-Mar-08
Document File: 2 page(s) / 28K

Publishing Venue

IBM

Related People

Rosenheim, DE: AUTHOR

Abstract

The above circuit is used to measure the forward recovery of a diode following reverse bias. The reverse biasing pulse shows the reverse recovery characteristic with no previous forward bias and therefore shows the effect of the junction capacitance on reverse recovery.

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A Diode Testing Circuit

The above circuit is used to measure the forward recovery of a diode following reverse bias. The reverse biasing pulse shows the reverse recovery characteristic with no previous forward bias and therefore shows the effect of the junction capacitance on reverse recovery.

A 20 millimicrosecond, 10 volt negative step from an SKL 503 Fast Rise Pulse Generator appears at point A, placing a back bias on the test diode. The inverted reflection from the short circuited line switches e(A) to plus 10 volts at the instant the negative pulse ends. Thus, the bias on the test diode goes from reverse to forward in about three millimicroseconds.

The input impedance of the H. P. 460B Wide Band Amplifier acts as a 185 ohm load for the test diode. The forward resistance of the diode at any time during the duration of the pulse is found by measuring e(A) the output with the test diode short circuited and e(B), the output with the test diode in the circuit. The forward resistance is then: See Original

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