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Sample Holder for Klepeis With Removable Insert

IP.com Disclosure Number: IPCOM000099230D
Original Publication Date: 1990-Jan-01
Included in the Prior Art Database: 2005-Mar-14
Document File: 3 page(s) / 107K

Publishing Venue

IBM

Related People

Benedict, JP: AUTHOR [+2]

Abstract

A sample holder for the Klepeis polisher 1 is which is designed to polish samples for inspection light microscope and SEM (Scanning Electron Microscopy). subject polisher has the following three important easy adjustment of the plane of polish, rigid for repeated use and maintainable polishing to keep the precision of the polisher. (Image Omitted)

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Sample Holder for Klepeis With Removable Insert

       A sample holder for the Klepeis polisher 1 is which is
designed to polish samples for inspection light microscope and SEM
(Scanning Electron Microscopy). subject polisher has the following
three important  easy adjustment of the plane of polish, rigid for
repeated use and maintainable polishing to keep the precision of the
polisher.

                            (Image Omitted)

      The sample holder consists of an L-shaped aluminum and an
aluminum SEM insert (Fig. 1).  The sample to polished is mounted onto
the aluminum SEM insert with phthalate wax.  The SEM insert is then
slid into the channel in the L-shaped bracket and held in place two
setscrews (Fig. 2).  The L-shaped bracket is, in bolted on the base
of the Klepeis polisher using the bolts that secure the standard
sample holder to this  Once this sample holder is attached to the
polisher, it will have a micrometer at the left a micrometer at the
right side and a third micrometer goes through the front of the
sample holder (Fig. 2). polisher with the sample holder is then
placed on a grinding wheel and the sample is polished.  The is
constantly examined from both the top and the side a light microscope
to determine the polishing quality proximity to the area of interest.
 The light microscope also used to adjust the side- to-side plane of
polish the two micrometers at the sides of the holder.  The of the
side-to-side adjustment possible with the polisher allows a parallel
cross section into rows of or devices to expose the maximum area for
material  The third micrometer, which goes through the holder, is not
used with this sample holder and is retracted into the sample holder.
 However, there times when the third micrometer is used as an
end-point or to adjust the front-to-back plane of polish.  A...