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Rapid Method to Monitor Adhesion Loss of Metal/Polymer Interfaces

IP.com Disclosure Number: IPCOM000099892D
Original Publication Date: 1990-Feb-01
Included in the Prior Art Database: 2005-Mar-15
Document File: 2 page(s) / 54K

Publishing Venue

IBM

Related People

Emmi, F: AUTHOR [+5]

Abstract

Disclosed is a method to predict the adhesion of thin metal/KAPTON* lines coated with a gold layer formed by standard TAB processing. The prediction of adhesion loss is empirically determined from results of actual samples subjected to 250 hours of conventional T/H testing (85oC/80% R.H.).

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Rapid Method to Monitor Adhesion Loss of Metal/Polymer Interfaces

       Disclosed is a method to predict the adhesion of thin
metal/KAPTON* lines coated with a gold layer formed by standard TAB
processing.  The prediction of adhesion loss is empirically
determined from results of actual samples subjected to 250 hours of
conventional T/H testing (85oC/80% R.H.).

      Fabrication of TAB metal/KAPTON lines involves the deposition
of sequential layers of chromium and copper on KAPTON.  After TAB
pattern formation, the metal leads are electrochemically coated with
gold.  During the electroplating, as specific deposition parameters
for a potassium-containing solution, KAPTON reduction is feasible. If
these parts are exposed to humidity and temperature environments, a
definitive edge develops.  Measurement of mechanical peel strength
decreases upon exposure, and typically these tests are performed
after a minimum of 250 hours at 85oC and 80% R.H.

      The disclosed method describes a procedure to obtain equivalent
T/H data in only one hour.  Correlation between samples exposed to
the standard test and their resulting peel strength values are
plotted against the measurements developed with the proposed
approach.

      The procedure is as follows:
1)   Long and straight lines are selected for the test.
2)   The test requires the treatment of the desired lines in boiling
water for 20 minutes.
3)   The exposed lines are peeled and the KAPTON side of t...