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Browse Prior Art Database

Modular Batch Automatic Testing Method And Apparatus

IP.com Disclosure Number: IPCOM000099976D
Original Publication Date: 1990-Mar-01
Included in the Prior Art Database: 2005-Mar-15
Document File: 2 page(s) / 77K

Publishing Venue

IBM

Related People

Parks, CL: AUTHOR [+2]

Abstract

A technique is shown for running a component (page) in its system environment, once to capture the pattern of input and response, and then using those signals to simulate that environment for other independent page component tests.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 52% of the total text.

Modular Batch Automatic Testing Method And Apparatus

       A technique is shown for running a component (page) in
its system environment, once to capture the pattern of input and
response, and then using those signals to simulate that environment
for other independent page component tests.

      A current method utilized for testing spare pages in many
systems is to test the pages in a system not yet sold or which is
mailed back from a customer. This test method, while effective,
requires the dedication of a significant capital resource. Some page
types may have only one backpanel slot available in the system and a
large order for a single page type may cause a testing backlog and
result in delivery delays to a customer. Also, the entire system is
repeatedly subjected to thermal cycling in order to complete spares
testing for a single page type, risking the potential for damage to
power supplies, cables, and individual solder joints. A new test
method captures the exact page stimulus at the backpanel/page
interface during the execution of system diagnostics to be stored for
later use as stimulus by a new page tester when testing other pages
of the same type. An added benefit is realized by not having to write
many individual page type tests.

      During execution of system diagnostics, the following guide
lines should be observed when capturing stimulus:
 1) The capture clock speed must be at least two times the system
clock speed in order to capture clock and clock speed control lines.
 2) Data must be captured on phases of the capture clock, and each
signal requires the appropriate phase at playback time on the tester.
 3) System signal loadi...