Browse Prior Art Database

Test Fixture Adapted for Use With Liquid Nitrogen

IP.com Disclosure Number: IPCOM000100329D
Original Publication Date: 1990-Apr-01
Included in the Prior Art Database: 2005-Mar-15
Document File: 1 page(s) / 31K

Publishing Venue

IBM

Related People

Green, DC: AUTHOR [+3]

Abstract

A removable frame fabricated to conform to the periphery of a circuit chip carrier enables test probing at room temperature and retains liquid nitrogen on the carrier surface to permit the probing at low temperature to obtain more convenient and reliable operating comparisons.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 100% of the total text.

Test Fixture Adapted for Use With Liquid Nitrogen

       A removable frame fabricated to conform to the periphery
of a circuit chip carrier enables test probing at room temperature
and retains liquid nitrogen on the carrier surface to permit the
probing at low temperature to obtain more convenient and reliable
operating comparisons.

      In the figure, chip carrier 1 with circuit chips 2 is supported
on connector 3 of test board 4.  A frame 5 is recessed along its
lower interior surface to form shoulder 6 that supports the frame on
the carrier.  This junction is sealed with a conforming material,
such as silicone rubber, by placing a continuous bead 7 of sealant in
the corner of the recess before seating the frame.

      The open frame permits the carrier circuits to be probed at
room temperature, or liquid nitrogen can be supplied and maintained
to a suitable depth within the frame to cool the chips and carrier;
probing can then be accomplished at the stabilized low temperature of
nitrogen at -195oC.