Browse Prior Art Database

Automated Recording of Test Process Data On Card

IP.com Disclosure Number: IPCOM000100419D
Original Publication Date: 1990-Apr-01
Included in the Prior Art Database: 2005-Mar-15
Document File: 2 page(s) / 67K

Publishing Venue

IBM

Related People

Douskey, SM: AUTHOR

Abstract

A method for storing information on a non-volatile RAM for use in the manufacturing process is disclosed. This information can then be retrieved for later inspection. This information not only takes the need for recording test completion codes out of the hands of the test operator, but also allows for review of actual previous test stations completed for failing cards, ready to be shipped cards, or even cards returned from the field.

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This is the abbreviated version, containing approximately 52% of the total text.

Automated Recording of Test Process Data On Card

       A method for storing information on a non-volatile RAM
for use in the manufacturing process is disclosed.  This information
can then be retrieved for later inspection. This information not only
takes the need for recording test completion codes out of the hands
of the test operator, but also allows for review of actual previous
test stations completed for failing cards, ready to be shipped cards,
or even cards returned from the field.

      Many cards being manufactured today have a non-volatile RAM
which stores unique card data.  This data contains card information,
such as the cards part number, serial number, and EC level.  Hardware
involved in storing this data allows reading, writing and data
retention even when power is removed from the card.  In this manner
the information stored during manufacturing is not lost on transport
to the field.

      This RAM can be used to advantage in a different manner.  By
adding an interface from each card (or using one in most cases
already provided), each test station can write into a predetermined
area of the RAM.  The information to be contained in this area can be
tailored to the amount of area remaining.  Space required can vary
from a minimum of one bit per test station to unique date, time, and
even test personnel fields.

      When a card completes a test at a test station, the code
automatically marks the card as good for that test. Should a card
fail the test, it will either be marked as bad or more likely just
not marked as run (bad bits are then not required, therefore, space
and resetting logic are not required).

      Successiv...