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External Spring to Provide Preload on a Single Plunger Spring Probe

IP.com Disclosure Number: IPCOM000100660D
Publication Date: 2005-Mar-16
Document File: 3 page(s) / 56K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method that uses an external spring on the top of a single plunger spring probe; the external spring provides the preload to the cylinder. Benefits include a solution that provides enough force to ensure a proper preload but does not deform the contactor housing.

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External Spring to Provide Preload on a Single Plunger Spring Probe

Disclosed is a method that uses an external spring on the top of a single plunger spring probe; the external spring provides the preload to the cylinder. Benefits include a solution that provides enough force to ensure a proper preload but does not deform the contactor housing.

Background

Sockets or contactors are commonly used in the semiconductor industry in test operations, such as Burn-In and other functions. The normal configuration is a dual plunger spring probe (see Figure 1A), but current electrical requirements are pushing the mechanical limits of these spring probes. Also, dual plunger spring probes have a higher contact resistance (C-res), due to a greater resistance caused by moving parts. To address new electrical requirements, shorter springs or contactor probes are used to achieve better travel on the package side.

Another limitation of the dual plunger spring probes (and the normal configuration of the single plunger probe), is that they use the same spring to provide the preload contact force.  If the force of the preload is too great, it can cause deformations or warpage on the contactor.

Using longer spring probes currently solves the limited travel issues; however, longer spring probes are susceptible to higher bulk resistance and inductance. High-power delivery to packages requires short spring probes; these probes have higher spring forces that reduce contact resistance.

General Descri...