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Algorithm to Determine Feedback Loop Cuts for Test Generation

IP.com Disclosure Number: IPCOM000100692D
Original Publication Date: 1990-May-01
Included in the Prior Art Database: 2005-Mar-16
Document File: 4 page(s) / 89K

Publishing Venue

IBM

Related People

Shearon, PC: AUTHOR

Abstract

This article describes an algorithm to determine feedback loop cuts for test generation, implemented in Extended Test Generation Software, increased test coverage and reduced running time. The advantage of this approach over prior art is that it determines more effective feedback cuts as measured by increased test coverage and reduced running time.

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Algorithm to Determine Feedback Loop Cuts for Test Generation

       This article describes an algorithm to determine feedback
loop cuts for test generation, implemented in Extended Test
Generation Software, increased test coverage and reduced running
time.  The advantage of this approach over prior art is that it
determines more effective feedback cuts as measured by increased test
coverage and reduced running time.

      The following are new features contained in the algorithm:
   1.  The first priority is to cut a net which is in the most loops
in DETERMINE CUTS.
           2.  The second priority is to cut the net fed by the input
block with the highest output weight (determined when all inputs must
be assigned in order to produce the output block value) in DETERMINE
CUTS.
           3.  All loops with the cut net are removed from further
consideration in REMOVE THE CUT LOOPS.

      The weight list contains an entry for each block in the logic
circuit, as shown in Fig. 1,
      where:    CFWTASS is the come from weight assignment:
                0=unused.
                1=the output weight for the logic value one (WT1) of
the come from block (OUTBLK) determines the cut location.
   2=the output weight for the logic value zero (WTO) of the come
from block (OUTBLK) determines the cut loca               tion.
   WTO measures the difficulty of producing a logic O on the outpu...