Browse Prior Art Database

Economical Process for Feature Electronic Card Reliability Testing

IP.com Disclosure Number: IPCOM000100891D
Original Publication Date: 1990-Jun-01
Included in the Prior Art Database: 2005-Mar-16
Document File: 2 page(s) / 51K

Publishing Venue

IBM

Related People

Breyfogle, FW: AUTHOR

Abstract

The Poisson distribution is often used to design tests to certify both product and feature electronic card failure criteria. Unfortunately, with the low failure rate criteria for most feature cards, this statistical methodology can yield an unrealistic sample size and test duration. When production volumes are low, the problem is amplified. It can become questionable whether significant resources should be reassigned from the overall product quality effort to criteria verification of a feature card that will not have much production volume. A process is disclosed that addresses these issues.

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Economical Process for Feature Electronic Card Reliability Testing

       The Poisson distribution is often used to design tests to
certify both product and feature electronic card failure criteria.
Unfortunately, with the low failure rate criteria for most feature
cards, this statistical methodology can yield an unrealistic sample
size and test duration.  When production volumes are low, the problem
is amplified.  It can become questionable whether significant
resources should be reassigned from the overall product quality
effort to criteria verification of a feature card that will not have
much production volume.  A process is disclosed that addresses these
issues.

      In this process, tests are directed toward minimizing the
impact to overall program product repair cost, as opposed to the
traditional "certification" of the individual failure criteria for
each card type.  The basic objectives of this process are:
      a.   Test low failure rate feature cards less if there are low
production volume plans.
      b.   Balance reliability test efforts to the "big picture"
(i.e., overall product reliability improvement).

      The basic test strategy is to determine whether the overall
product field failure expense would be increased excessively if the
feature card did not perform at its criteria because of a limited
reliability test effort. The process to do this is:
      a.   Choose a convenient 1 year, 0 fail warranty test sample
...