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Method for a probe tool

IP.com Disclosure Number: IPCOM000101777D
Publication Date: 2005-Mar-16
Document File: 2 page(s) / 9K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for a probe tool. Benefits include improved functionality, improved performance, improved reliability, and an improved test/repair environment.

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Method for a probe tool

Disclosed is a method for a probe tool. Benefits include improved functionality, improved performance, improved reliability, and an improved test/repair environment.

Background

              Conventionally, failure analysis on a central processing unit (CPU) requires the probing of each and every pin to find opens, shorts and or abnormal readings. An in-target probe (ITP) is used to find open and/or shorted data pins, but it cannot identify shorted, open, or damaged address, control, voltage control circuits (VCC), and ground (GND) pins. A CPU can have several hundred pins. The probing process can become tedious and can lead to human error in the test results. An automated procedure is required.

General description

              The disclosed method is a probe tool that measures all the pins in a socket. Switching logic selects rows and columns to be tested. The result of each measurement is uniquely associated with a pin number and/or node name and retained in a spreadsheet or table in a storage device.

              When compared to known good data, abnormal readings indicate pin shorts or opens and defective equipment, such as memory controller hubs (MCHs).

Advantages

              The disclosed method provides advantages, including:
•             Improved functionality due to probing all the pins of a CPU to find shorts, opens, and/or abnormal readings

 •    Improved performance due to automating the testing procedure
•             Improved reliability due to minimizing the human error in the testing procedure

•             Improved test/repair environment due to automating the testing procedure

Detailed desc...