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Non-Destructive Method for Measuring Peeling Energies Using Delectric Spectroscopy

IP.com Disclosure Number: IPCOM000102529D
Original Publication Date: 1990-Nov-01
Included in the Prior Art Database: 2005-Mar-17
Document File: 2 page(s) / 61K

Publishing Venue

IBM

Related People

Cuomo, JJ: AUTHOR [+2]

Abstract

Disclosed is a method for the determination of the peeling energy of metals on polyimides (PIs) using Frequency-Domain Dielectric Spectroscopy (FDDS).

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This is the abbreviated version, containing approximately 74% of the total text.

Non-Destructive Method for Measuring Peeling Energies Using Delectric Spectroscopy

       Disclosed is a method for the determination of the
peeling energy of metals on polyimides (PIs) using Frequency-Domain
Dielectric Spectroscopy (FDDS).

      FDDS is a technique commonly used of the investigation of
interface phenomena in electrochemical systems [1].  The dielectric
response function of the cell is determined by several contributions,
which can be taken apart once the complex impedance of the system (or
related quantities) is known over a large frequency range.
Electrode-related phenomena mainly contribute in the audio-frequency
range (from 0.01 mHz to 100 kHz).

      Adhesion is also related, although in a very complex manner, to
the interface structure.  It depends on the bond structure and
strength (adhesion energy), and on eventual modifications of the
topmost layers of the substrate (stress-controlled adhesion) as well
[2].

      Examination of the real part of the impedance function in
ion-bombarded PIs shows the occurrence of anomalies which cannot be
explained in terms of classical Debye relaxation processes (Fig. 1).
Also, ion- bombarded PIs display improvement in their adhesion
properties.

      A correlation has been found between peeling energy (as
determined by 90o-peel tests) and the surface component of the
impedance response function for a number of metallized PIs which
underwent different ion- bombardment treatements (Fig. 2)....