Browse Prior Art Database

Power Analog Control Test Interface

IP.com Disclosure Number: IPCOM000102719D
Original Publication Date: 1990-Dec-01
Included in the Prior Art Database: 2005-Mar-17
Document File: 2 page(s) / 57K

Publishing Venue

IBM

Related People

Murray, T: AUTHOR

Abstract

Disclosed is a device to allow functional testing of the Power Analog Control (PAC) module used in a Direct Access Storage Device (DASD) system without using the actual DASD system electronics.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 58% of the total text.

Power Analog Control Test Interface

       Disclosed is a device to allow functional testing of the
Power Analog Control (PAC) module used in a Direct Access Storage
Device (DASD) system without using the actual DASD system
electronics.

      The need has arisen to functionally test the PAC module without
using the system Device Electronics (DE).  During qualification
approval life testing of a PAC unit, many modules are run for long
periods of time under stress conditions.  As this work starts before
regular production begins, system units are very expensive to obtain
and are subject to frequent engineering change activity.  Also,
certain defects in a PAC unit can potentially cause damage to
expensive disk drive units and/or the DE.  By testing with a
relatively inexpensive test unit first, the risk of this damage can
be substantially reduced. Device Description

      The PAC module has three main functions:
 1.  Power supply
 2.  Motor drive and control
 3.  Power amplifiers

      Emulating functions of the DE, using a combination of both
hardware and software, allow all of the communication functions of
the PAC unit to be tested using the interface board and an IBM PC,
rather than requiring expensive and scarce prototype DE modules.
Also, the DE control and status monitoring of the PAC functions is
readily accomplished.  By implementing major control logic in
Erasable Programmable Logic Device (EPLD) chips, system changes can
be implemented...