Browse Prior Art Database

Screening Head Non-Contact Set Up Head

IP.com Disclosure Number: IPCOM000103014D
Original Publication Date: 1990-May-01
Included in the Prior Art Database: 2005-Mar-17
Document File: 1 page(s) / 35K

Publishing Venue

IBM

Related People

Miller, TL: AUTHOR [+2]

Abstract

The disclosed measurement tool is useful for precise set-ups of a thick film extrusion-type screening head. It can also be used to measure flatness of ceramic substrates at the screening station.

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Screening Head Non-Contact Set Up Head

      The disclosed measurement tool is useful for precise set-ups of
a thick film extrusion-type screening head.  It can also be used to
measure flatness of ceramic substrates at the screening station.

      Fig. 1 shows the tool configuration.  Test head probe fixture 1
is inserted into supply tube holder 5 as a replacement to the
standard screening supply tube assembly (not shown).  Eddy current
proximity sensors 2 are positioned in a way that three sensors
measure the location of a tool reference surface 3 and the remainder
measure the surface of the ceramic substrate in position 6.  A data
logger or PC 7 is used to analyze the measurements for flatness and
planarity between the two surfaces.

      The screening tool can be adjusted for the required screening
set up.  Also this same tool is capable of measuring additional
ceramic substrates to determine the flatness of a sample lot.

      Disclosed anonymously.