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Browse Prior Art Database

Fixed Probe Test Adapter

IP.com Disclosure Number: IPCOM000103430D
Original Publication Date: 1990-Nov-01
Included in the Prior Art Database: 2005-Mar-17
Document File: 1 page(s) / 48K

Publishing Venue

IBM

Related People

Burns, FC: AUTHOR [+4]

Abstract

Disclosed is a device for contacting printed circuit products containing very small electrical contact features. The Fixed Probe Test Adapter (FPTA) illustrated in the figure is used to adapt commercially available bed-of-nails test equipment to printed circuit products with .004" diameter test features on .008" pitch. The novel contributions of the device are its low cost, high accuracy and ability to simultaneously contact both sides of printed circuit products containing large active areas with several thousand contact features. (Image Omitted)

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 88% of the total text.

Fixed Probe Test Adapter

      Disclosed is a device for contacting printed circuit products
containing very small electrical contact features. The Fixed Probe
Test Adapter (FPTA) illustrated in the figure is used to adapt
commercially available bed-of-nails test equipment to printed circuit
products with .004" diameter test features on .008" pitch.  The novel
contributions of the device are its low cost, high accuracy and
ability to simultaneously contact both sides of printed circuit
products containing large active areas with several thousand contact
features.

                            (Image Omitted)

      The FPTA is composed of a double sided printed circuit device
(1) with conically shaped test probes (2) affixed to pads on its
"product under test" (3) (PUT) side.  The test probes are arranged in
a mirror image of the contact pattern on the PUT.  The test probes
are electrically distributed to a matrix of large, widely spaced pads
on the top side of the adapter (5) via the multilayer printed circuit
device (1). The printed circuit device adapts the standard footprint
of the bed-of-nails (6) to the unique, high density pattern of the
PUT.

      The unique shape of the test probe (2) provides a highly
reliable electrical contact between the adapter and the PUT.  The
high profile and sharp point of the test probe enables the adapter to
bridge and/or penetrate debris and oxides on the electrical interface
to the product.  T...