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A Non-Destructive Test (NDT) for Measuring the Surface Finish on Magnetic Data Cartridge Tape

IP.com Disclosure Number: IPCOM000103503D
Original Publication Date: 1990-Dec-01
Included in the Prior Art Database: 2005-Mar-18
Document File: 1 page(s) / 33K

Publishing Venue

IBM

Related People

Klingerman, MD: AUTHOR

Abstract

Described is a new method for measuring Data Cartridge Tape surface finish (roughness). The test is entirely non-destructive since the tape is not removed from the cartridge for testing nor is the tape damaged in any way by the test procedure. This allows the tape to be reused for further testing or experimentation and would also allow the procedure to be used as an on-line quality measure.

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A Non-Destructive Test (NDT) for Measuring the Surface Finish on Magnetic Data Cartridge Tape

      Described is a new method for measuring Data Cartridge Tape
surface finish (roughness).  The test is entirely non-destructive
since the tape is not removed from the cartridge for testing nor is
the tape damaged in any way by the test procedure.  This allows the
tape to be reused for further testing or experimentation and would
also allow the procedure to be used as an on-line quality measure.

      This method uses an optical (noncontact) profiler (WYCO or
equivalent).  The NDT procedure is as follows:
1.  Open the access door on the cartridge using adhesive tape to hold
in the open position
2.  Insert two shims (tapered glass stoppers, size approximation .250
X .375 ", under the tape holding the tape taut and exposing a sample
of tape for optical profilometry or other noncontact, nondestructive
analysis
3.  Using this method the tape can be advanced as needed for
repetitive measurements.

      This method does not change the characteristics of the tape in
any manner; therefore, the tape product can be used as designed or
can be used for additional testing.

      Disclosed anonymously.