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Method to Precisely Detect and Pinpoint Shorts between Two Conductors

IP.com Disclosure Number: IPCOM000104402D
Original Publication Date: 1993-Apr-01
Included in the Prior Art Database: 2005-Mar-19
Document File: 2 page(s) / 58K

Publishing Venue

IBM

Related People

Buliszyn, S: AUTHOR [+2]

Abstract

Disclosed is a technique to precisely determine the distance to a short between two conductors for purposes of pinpointing and failure analyzing the shorting condition.

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Method to Precisely Detect and Pinpoint Shorts between Two Conductors

      Disclosed is a technique to precisely determine the distance to
a short between two conductors for purposes of pinpointing and
failure analyzing the shorting condition.

      In Fig. 1, digital multimeter (DMM) frame 1 is depicted with
microprocessor 2, switching relays 4 & 5, and probe output connectors
6.  Current source Im and voltage source Vm facilitate driving
current and driving voltage respectively.  Probe connections are made
to conductors 7 and 8 through endpoints E1, E2, and REF connection.

      Now, in Fig. 2, relays 4 & 5 are switched initially to permit
the electrical circuit of State 1 to occur.  Im flows through
conductor 7 and produces potential Vt.  Relays 4 & 5 are now switched
to permit the electrical circuit of State 2 to occur.  Because of the
near infinite input impedance of voltage source Vm, V-(REF)
connection is electrically right at the shorting condition.  This
facilitates the measurement of potential V1.  Relays 4 & 5 are
switched to State 3, where the V + (REF) connection is electrically
right at the shorting condition, which facilitates the measurement of
potential V2.

      Vt is proportional to the length of conductor 7, and V1 and V2
are proportional to the distances from E1 and E2 respectively to the
shorting condition.  This permits precise short determination and the
distances and/or the percentages of conductor lengths are calculated
...