Browse Prior Art Database

Test Method for Soldering of LSI Input Pin

IP.com Disclosure Number: IPCOM000104596D
Original Publication Date: 1993-May-01
Included in the Prior Art Database: 2005-Mar-19
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Nishioka, Y: AUTHOR

Abstract

Disclosed is a method for testing an LSI input pin using an LSI internal circuit in order to detect an open and/or short circuit due to bad solder.

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This is the abbreviated version, containing approximately 100% of the total text.

Test Method for Soldering of LSI Input Pin

      Disclosed is a method for testing an LSI input pin using an LSI
internal circuit in order to detect an open and/or short circuit due
to bad solder.

      Fig. 1 shows the example of this method.  To detect a open
circuit, set Q1, Q2 and Q3 to high by Tin 1 and Tin 2.  Then set
INPUTs to high by turning and checking Tout.  If there is any open
circuit, Tout does not go to high when set input pin, which has open
circuit, to high.

      To detect a short circuit, set Q1, Q2, Q3 to low and set INPUTs
to high by turning as shown Fig. 2, and checking Tout.  If there is
any short circuit, Tout goes high.

      The numbers of INPUT pin are not limited on this method.  Also,
the test circuit does not depend on other internal circuit and
physical pin assignment.