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Automated Association of Defects to Test Scenarios

IP.com Disclosure Number: IPCOM000105295D
Original Publication Date: 1993-Jul-01
Included in the Prior Art Database: 2005-Mar-19
Document File: 2 page(s) / 71K

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Related People

Carpenter, ER: AUTHOR [+5]


Disclosed is a method of establishing and tracking the association of defects with test scenarios.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 52% of the total text.

Automated Association of Defects to Test Scenarios

      Disclosed is a method of establishing and tracking the
association of defects with test scenarios.

      A common problem faced in a test environment is how to map
defects to test scenarios in an automated fashion.  In previous
years, this has always been a manual process, with the defects that
held a certain test being tracked on the team leads clipboard.

      We needed to organize the information to make it easier for us
to track and present the data, and make it readily available for
post-mortem analysis.  We wanted to be able to indicate the relative
importance of a defect to the testing effort.  We also wanted to have
this process as automated as possible (both the association and the
disassociation when the problem was fixed), and eliminate the need
for that dreadful clip- board.

      To address all of these issues, a system was created to allow
the tracking of defects which are associated with test scenarios.
These defects are stored in a database, and associated with a
particular test scenario also stored in the database.  A front end
user interface allows a user to input the necessary information, and
back ends allow the extraction of tables and graphs portraying the

      Options exist in the system to mark each defect as either "hot"
(a problem requiring special focus), "holding" (a problem which
causes test case failures), or both.  This information is then
tracked, and the system has options to print this information as a
formatted textual document or a graphical chart.

      The system will automatically issue queries at any given
interval to determine the state of defects and their associated
tests.  If the state of a defect shows that it is fixed, and the test
scenario associated with it has run 100% successfully, then a
disassociation will occur f...