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Browse Prior Art Database

External Diskette Drive with Accessible Test Points

IP.com Disclosure Number: IPCOM000106511D
Original Publication Date: 1993-Nov-01
Included in the Prior Art Database: 2005-Mar-21
Document File: 2 page(s) / 47K

Publishing Venue

IBM

Related People

Chandra, P: AUTHOR

Abstract

Described is a hardware implementation to provide external diskette drive mechanisms with an enclosure that enables the drive's internal test points to be accessible without disassembling the enclosure or without the use of external connectors.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 77% of the total text.

External Diskette Drive with Accessible Test Points

      Described is a hardware implementation to provide external
diskette drive mechanisms with an enclosure that enables the drive's
internal test points to be accessible without disassembling the
enclosure or without the use of external connectors.

      In prior art, the testing of external diskette drives, as used
with personal computer systems, required that the enclosure housing
be disassembled so as to have access to the internal test pins of the
drive and associated logic.  Alternative designs called for the use
of a separate connector to be brought out of the enclosure for test
purposes.  However, separate connectors could result in noise
injection and a change in the impedance of the signals at the
connector, as compared to the impedance at the test points on the
drive's logic circuit card.

      The concept described herein involves an alteration of the
enclosure so as to provide a cut-out in the underside of the
enclosure.  Inside the enclosure, a cut-out is provided on a small
logic circuit board so that the test points that are located at the
drive itself will be accessible.  All test points are then accessible
through the cut-out.  Spring loaded test pins, which are part of the
tester, make direct contact to the pads at the test points inside the
enclosure.  The contact provides the smallest path for the signals to
travel so as to provide a minimal change in signal impedance as
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