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Method for Dynamic Test of a Battery Backup in a System Environment

IP.com Disclosure Number: IPCOM000106531D
Original Publication Date: 1993-Nov-01
Included in the Prior Art Database: 2005-Mar-21
Document File: 2 page(s) / 45K

Publishing Venue

IBM

Related People

Brocko, RG: AUTHOR [+2]

Abstract

A method for testing batteries in a Battery Backup (BBU) in a system environment is described.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 85% of the total text.

Method for Dynamic Test of a Battery Backup in a System Environment

      A method for testing batteries in a Battery Backup (BBU) in a
system environment is described.

      A battery test can be performed on a power conversion
configuration such as is shown in the figure by lowering the
delivered potential of the AC-to-DC converter.  The system will then
load the battery during the test phase.  If the battery is weak, a
battery low signal will be asserted before the normal operating time
allowed.  This in turn presents a service repair check to the control
panel.  The circuitry to detect battery low is in the BBU.

      The sequence is initiated with a control signal from the
control panel and operating system.  The signal is presented to the
bulk AC-to-DC power converter.  In a typical application, the
reference potential circuitry is modified such that two delivered
potentials are available.

      The isolating diode D1 is not required if the bulk potential
generating circuit can be back fed without damage or useless
dissipation.

      The normal buss potential is greater than the maximum battery
potential plus whatever potential is sufficient to allow charger
operation.  The test potential is less than the minimum expected
battery potential but greater than the minimum load required
operating potential.

      The 32V, 18V, and 24V potentials are illustrative.  The concept
is that 32V is sufficiently greater than the battery potentia...