Browse Prior Art Database

Diagnostic Port for Computer Feature Cards

IP.com Disclosure Number: IPCOM000106532D
Original Publication Date: 1993-Nov-01
Included in the Prior Art Database: 2005-Mar-21
Document File: 2 page(s) / 84K

Publishing Venue

IBM

Related People

Osborn, NA: AUTHOR

Abstract

Disclosed is the provision of an additional connection for the attachment of power and signal lines to a computer feature card, to be used for test procedures verifying the proper functioning of the card during its manufacture.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 52% of the total text.

Diagnostic Port for Computer Feature Cards

      Disclosed is the provision of an additional connection for the
attachment of power and signal lines to a computer feature card, to
be used for test procedures verifying the proper functioning of the
card during its manufacture.

      As shown in the Figure, a feature card 10 includes a main
connection tab 12 with a relatively large number of gold-plated
contact pads 14, configured for making connection with a bus
connector 16 on the system board 18 of a computer system.  Card 10
also includes a separate diagnostic port tab 20, with a number of
gold-plated contact pads 21, configured for the attachment of test
equipment (not shown) by means of a mating insulation displacement
connector 22 attached to a cable 24.

      A number of tests are performed during the process of
manufacturing a card of this type.  Of particular importance is
burn-in testing, in which a card is operated at elevated temperatures
in an attempt to accelerate early life failures which would otherwise
occur after the sale of the card.  During such testing, the operation
of the card is monitored, so that any card experiencing a failure can
be rejected.  Thus, a test fixture, providing various electrical
connections for power and signals the card during the test process,
must be capable of being connected to many cards, one after another,
in a process for mass producing the cards.

      While contact pads 14 of main connection tab 12 include all of
the power and signal connections necessary for operation of the card,
the connector mating with tab 10 is, in several ways, unsuitable for
use in the test process.  In the example of a Micro Channel* feature
card, pads 14 are spaced at 0.050-inch increments along the edge of
tab 12.  This relatively tight spacing leads to a fragile
configuration of contact springs, with a limited useful life, in the
mating connector.  On the other hand, insulation displacement
connector 23 may be made according to a more robust design, having
contacts spaced at 0.100-inch increments, with a...