Browse Prior Art Database

Wired Suspension Assembly Hi-pot Test Electrical Connector

IP.com Disclosure Number: IPCOM000107575D
Original Publication Date: 1992-Mar-01
Included in the Prior Art Database: 2005-Mar-22
Document File: 2 page(s) / 65K

Publishing Venue

IBM

Related People

Brooks WW, Jr: AUTHOR [+3]

Abstract

Described is an integral wire clamp and electrical connector used for hipot testing. The design provides a textured, conductive surface which pierces the insulation when the wire is clamped. This eliminates the need to strip the wires, which would normally require additional labor, equipment, and space on the manufacturing line.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 78% of the total text.

Wired Suspension Assembly Hi-pot Test Electrical Connector

       Described is an integral wire clamp and electrical
connector used for hipot testing.  The design provides a textured,
conductive surface which pierces the insulation when the wire is
clamped.  This eliminates the need to strip the wires, which would
normally require additional labor, equipment, and space on the
manufacturing line.

      Refer to the figure for a schematic of the disclosed invention.
The connector consists of two wire clamping details as used on the
manufacturing line pallet.  The centerbody of the connector is a
moveable post, made from an insulating material, such as plastic or
cer amic.  The function of the centerbody is to position the leads
over the two special contact pads, and to apply clamping force to
both wires.  A spring on the bottom half of the centerbody applies
the clamping force, and clearance between the centerbody and the
connector bushing allows the centerbody to rock to securely clamp
both wires.

      The figure shows the left connector in the raised position used
during wire stringing and during wire scrap removal.  The right
connector is shown in the lowered (clamped) position.

      Contact with the wires is made by the two conical-shaped
conductors in each connector.  The flat top of each contact is used
as a target for externally applied pogo pins which complete the
circuit to the hipot test equipment.  The conical sides of these
contacts a...