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Puffed Weighted Random Pattern: A New Test Generation Method

IP.com Disclosure Number: IPCOM000108306D
Original Publication Date: 1992-May-01
Included in the Prior Art Database: 2005-Mar-22
Document File: 3 page(s) / 110K

Publishing Venue

IBM

Related People

Forlenza, D: AUTHOR [+3]

Abstract

This article proposes the generation of Weighted Random Pattern (WRP)- equivalent deterministic AC test patterns without the need for WRP tester hardware, thereby reducing the costly deterministic test data generation process and tester hardware requirements. Additionally, it provides a tool to evaluate WRP test pattern effectiveness.

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Puffed Weighted Random Pattern: A New Test Generation Method

       This article proposes the generation of Weighted Random
Pattern (WRP)- equivalent deterministic AC test patterns without the
need for WRP tester hardware, thereby reducing the costly
deterministic test data generation process and tester hardware
requirements.  Additionally, it provides a tool to evaluate WRP test
pattern effectiveness.

      The WRP test methodology and system used for testing pure logic
with embedded memories has many test cost and quality advantages
demonstrated in (*).  The cost of deterministic test generation and
the volume of data transmitted and stored at manufacturing locations
can be dramatically reduced with WRP.  This article describes a novel
approach of deterministic test data generation based on the WRP
methodology.  The idea consists of expanding or "puffing" the WRP
patterns into deterministic-like patterns.  This eliminates the need
for costly conventional pre-calculated deterministic test generation
while taking advantage of the enhanced WRP test effectiveness.  The
flow and process of this methodology is depicted in the figure.

      This concept allows a WRP "equivalent" test, with high DC and
AC effectiveness, to be applied on a conventional deterministic-only
test system.  In addition, this "puffed" WRP pattern set, or rather
this deterministic AC test data, is generated such that it is
compatible with today's existing deterministic test data, and hence,
is independent of Test Data Supply (TDS) and tester hardware; this
transparency through the post-processing software allows any
deterministic tester AC capability without the need for WRP tester
hardware.

      Another benefit of this new concept is that it provides a tool
to evaluate the WRP effectiveness.  Testers without WRP hardware and
software capability must demonstrate equivalent or better test
effectiveness relative to current WRP test systems.  An example of
this tool would be to evaluate and qualify new vendor test sy...