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Magnetic and Structural Properties of CoPtCr Alloy Films using Sn, Cr-Sn Alloy, and Cr/Sn Multilayer Structures

IP.com Disclosure Number: IPCOM000108554D
Original Publication Date: 1992-Jun-01
Included in the Prior Art Database: 2005-Mar-22
Document File: 2 page(s) / 78K

Publishing Venue

IBM

Related People

Ahlert, RH: AUTHOR [+2]

Abstract

The use of Sn, Cr/Sn (multilayer) and Cr-Sn alloy underlayer films can improve the magnetic properties of CoPtCr magnetic media. The effect of Sn, Cr/Sn (multilayers) and Cr-Sn (alloy) underlayer films on the magnetic properties of CoPtCr film media have been investigated. For comparison, CoPtCr media films were deposited (in the same sputtering system) onto Cr underlayer films of similar thickness. The substrates were either Si or NiP/AlMg, and the sputter deposition was accomplished in a SFI (Sputtered Films Incorporated) system. All films were deposited at 3 millitorr at the same power level. The substrate temperature was either 25 degrees centigrade or 150 degrees centigrade. To examine the dependence of media composition, we evaluated different alloys of CoPtCr (Co-11Pt-18Cr; Co-12Pt-10Cr; Co-9Pt-17Cr).

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Magnetic and Structural Properties of CoPtCr Alloy Films using Sn, Cr-Sn Alloy, and Cr/Sn Multilayer Structures

       The use of Sn, Cr/Sn (multilayer) and Cr-Sn alloy
underlayer films can improve the magnetic properties of CoPtCr
magnetic media.  The effect of Sn, Cr/Sn (multilayers) and Cr-Sn
(alloy) underlayer films on the magnetic properties of CoPtCr film
media have been investigated.  For comparison, CoPtCr media films
were deposited (in the same sputtering system) onto Cr underlayer
films of similar thickness.  The substrates were either Si or
NiP/AlMg, and the sputter deposition was accomplished in a SFI
(Sputtered Films Incorporated) system.  All films were deposited at 3
millitorr at the same power level.  The substrate temperature was
either 25 degrees centigrade or 150 degrees centigrade.  To examine
the dependence of media composition, we evaluated different alloys of
CoPtCr (Co-11Pt-18Cr; Co-12Pt-10Cr; Co-9Pt-17Cr).

      When Co-11Pt-18Cr media was deposited on 500 angstroms of Sn,
the coercivity was 1935 Oe compared to only 1125 Oe when a 500
angstroms Cr layer was used as the underlayer. The Sn underlayer
structures (Sn,Cr/Sn,Cr-Sn) deposited directly onto NiP/AlMg
substrates and Si produced increases in Hc ranging from 17-72%
greater than identical structures using Cr underlayers.  When the
media composition was changed to Co-12Pt-10Cr, a 500-angstrom Sn
underlay film yielded a coercivity of 1835 Oe (media thickness 300
angstroms) compared to 1565 Oe for the Cr control underlayer.
Changing the media alloy to Co-9Pt-17Cr and using 500 angstroms of Sn
produced a coercivity of over 2000 Oe compared to 1320 Oe for Cr.
The % increase...