Browse Prior Art Database

Impact Shock Test Device

IP.com Disclosure Number: IPCOM000108607D
Original Publication Date: 1992-Jun-01
Included in the Prior Art Database: 2005-Mar-22
Document File: 2 page(s) / 70K

Publishing Venue

IBM

Related People

Binkley, T: AUTHOR [+2]

Abstract

Disclosed is a device that measures the dynamic force required to crack a plastic discrete or integrated circuit (IC) component package. This free-standing device contains a transducer that measures the impact force from a free falling weight. The test procedure is described below and the device is shown in Fig. 1.

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Impact Shock Test Device

       Disclosed is a device that measures the dynamic force
required to crack a plastic discrete or integrated circuit (IC)
component package.  This free-standing device contains a transducer
that measures the impact force from a free falling weight.  The test
procedure is described below and the device is shown in Fig. 1.

      Fig. 1 shows Handle 1, Top Plate 2, Arm Bracket 3, T-Shaft 4,
Plunger-T 5, Anvil Holder 6, Anvil 7, Sensor-PLB Series ZO8 8, Sensor
Base 9, Base 10, Locating Pins 11, Plunger-B 12 and Air Assembly 13.

      This device can be used on any product in a plastic package.
The results of using this device can be directly related to the
curing efficiency of the plastic epoxy and/or to the assignment of
the maximum allowable forces the handling equipment may exert on the
plastic component so the integrity of the package is not compromised.

      The most useful application is to obtain the X, Y, and Z forces
needed to crack the device.  The reason for obtaining this force data
is to set maximum force limits on the handling equipment, such as
'pick and place' equipment used in populating boards or panels in the
assembly line.  A typical readout on the oscilloscope and the graphic
results comparing three difference sources for one component
utilizing this test is shown in Fig. 2.
 IMPACT TEST PROCEDURE
1.   Set up the oscilliscope to give full-screen resolution at the
anticipated force/voltage readings.
2. ...