Browse Prior Art Database

Test Design Automation Compatible Common On Chip Processor

IP.com Disclosure Number: IPCOM000108673D
Original Publication Date: 1992-Jun-01
Included in the Prior Art Database: 2005-Mar-22
Document File: 3 page(s) / 109K

Publishing Venue

IBM

Related People

Jaber, TK: AUTHOR [+2]

Abstract

The self-test controller implemented on the IBM RISC System/6000* (RS/6000) processor chip set and called COP (Common On-Chip Processor) did not meet all the TDA (Test Design Automation) software design requirements. Consequently, TDA software tools and routines used for the calculation of chip Built-In Self-Test (BIST) test coverage and for the generation of BIST golden signatures could not be used on the RS/6000 processor chip set. This article describes the design changes recently implemented on the RS/6000 COP design to make it TDA compatible, thereby making it possible to obtain self-test coverage figures and to generate consistent self-test golden signatures across first and second package levels.

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Test Design Automation Compatible Common On Chip Processor

       The self-test controller implemented on the IBM RISC
System/6000* (RS/6000) processor chip set and called COP (Common
On-Chip Processor) did not meet all the TDA (Test Design Automation)
software design requirements. Consequently, TDA software tools and
routines used for the calculation of chip Built-In Self-Test (BIST)
test coverage and for the generation of BIST golden signatures could
not be used on the RS/6000 processor chip set.  This article
describes the design changes recently implemented on the RS/6000 COP
design to make it TDA compatible, thereby making it possible to
obtain self-test coverage figures and to generate consistent
self-test golden signatures across first and second package levels.

      The COP design for the processor chip set was a true BIST
implementation.  It was a self-test controller which resided on chip
and provided self-test control by means of control logic totally
embedded on chip.  The chip BIST architecture configuration (STUMPS)
was also completely achieved by means of on-chip COP logic, as was
the self-test sequence and clock control.  Since the COP was the
controller and it resided on chip, care was taken to isolate the chip
COP logic from the rest of the chip logic during BIST execution and
the self-test controller did not test itself.

      Fig. 1 shows a diagram of the COP logic and control as
implemented on the RS/6000 processor chip set.  For further details
on the COP design, please refer to (*).

      The RS/6000 COP design characteristics were in violation of the
TDA software design requirements which included the following design
rules:
      The self-test control logic must not reside on chip and
self-test control must be achieved by means of, and through, chip
Primary Input (PI) pins.  An external self-...